Are you an engineer or scientist with experience of Atomic Force Microscopy (AFM) who enjoys solving complex technical challenges and working directly with customers?
We're looking for an AFM Applications Engineer to help develop, demonstrate and optimise the capabilities of our industry-leading semiconductor metrology technology.
This role sits at the intersection of customers, engineering and product development. You'll work hands-on with advanced instrumentation, helping customers extract maximum value from our technology while influencing future product development through real-world application insight.
If you enjoy combining scientific problem-solving, technical customer engagement and cutting-edge measurement technology, we'd love to hear from you.
- Leading customer demonstrations, evaluations and characterisation programmes
- Developing innovative measurement approaches for semiconductor applications
- Analysing experimental data and presenting technical findings to customers and internal stakeholders
- Acting as the technical lead for application-related customer support and problem-solving activities
- Working across software, hardware, optics and systems engineering teams to resolve complex technical challenges
- Driving application-focused projects that improve customer outcomes and product performance
- Developing new measurement methodologies and characterisation techniques
- Gathering customer feedback and translating insights into future product enhancements
- Supporting the ongoing development of our applications laboratory and technical capability
- Travelling internationally (typically 10–20%) to support customer projects and evaluations
- Atomic Force Microscopy (AFM) - essential
- Semiconductor Metrology
- Semiconductor Process Characterisation
- Surface Analysis
- Scientific Instrumentation
- Advanced Microscopy
- Nanoscale Measurement
- Materials Characterisation
- Process Control and Defect Inspection
- Hands-on experience using Atomic Force Microscopy (AFM)
- Working within technical engineering, scientific or instrumentation environments
- Supporting customer-facing technical activities including demonstrations, evaluations or product validation
- Characterising complex systems, instruments or measurement platforms
- Strong experimental problem-solving skills
- Presenting technical information clearly to both technical and non-technical audiences
- Working effectively across multidisciplinary engineering and scientific teams
- Willingness to undertake international travel
- Semiconductor manufacturing or semiconductor process environments
- Semiconductor metrology or inspection systems
- Scanning Electron Microscopy (SEM)
- Optical systems, lasers or fibre-optic technologies
- Precision electromechanical systems
- Product marketing or customer-led product development experience
- Data analysis, scientific computing or statistical analysis
- Experience within a high-growth technology company
- Master's degree, PhD or degree in Physics, Materials Science, Engineering, Nanotechnology or a related scientific discipline
or
- Equivalent commercial experience gained through AFM, semiconductor metrology or advanced scientific instrumentation
Infinitesima develops advanced AFM-based metrology technology used by leading semiconductor manufacturers to solve increasingly complex nanoscale measurement challenges.
As semiconductor devices become smaller and more complex, accurate measurement becomes increasingly critical. Our technology helps enable the next generation of AI, advanced computing and semiconductor innovation.
You'll join a highly skilled team of scientists and engineers where your expertise will directly influence both customer success and the future direction of our products.
This is a rare opportunity to work on genuinely cutting-edge AFM technology while remaining close to customers, applications and real-world semiconductor manufacturing challenges.
We welcome applicants from all backgrounds.
This role requires permanent right to work in the UK. Sponsorship is only considered in rare cases.
